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Measurement Solutions

Powerful solutions designed for efficiency

Measurement Solutions

Power up your testing capabilities with cutting-edge measurement solutions! From high-speed scopes to advanced BERTs, these integrated ATE extensions and turnkey solutions ensure seamless, at-speed testing up to 112 Gbps—enabling next-level performance for high-speed I/O devices.

BERT - Bit Error Rate Testers

Bit error rate testers (BERTs) are usually the initial step in communications testing. They generate digital test patterns, typically pseudorandom binary sequences (PRBSs), that drive devices under test (DUTs). After the signal is transmitted through the link, the BERT receiver captures it. This setup can be used for multiple testing purposes, such as evaluating the performance of a transmitter, a receiver, or an optical link.

DSO

Digital Sampling Oscilloscope

Digital sampling oscilloscopes (DSO) are essential for evaluating transmitter performance using jitter and eye diagram analysis. They are sometimes used in conjunction with a BERT. The BERT generates the digital test pattern, while the oscilloscope analyses the signal after it has run through the DUT.

DSO

TDR - Time Domain Reflectometer

TDR (Time Domain Reflectometer) is the ideal tool for testing cables and interconnects. It utilises time domain reflectometry and transmission to accurately measure network return loss (S11), propagation loss (S21), and crosstalk.

OCR - Optical Clock Recovery

Optical clock-recovery modules are required when a clock signal is not present to trigger the oscilloscope or when it is better to use the embedded clock present in the data stream, such as for 100G Lambda optical signals.

Clock-recovery modules are essential for transmitter signal characterisation.

Optical Switch Box

Optical Switch Box

An optical switch box is needed so that automated test platforms can permit the system to measure the performance of transmitters and receivers at multiple wavelengths or channels. The Multilane Optical Switch Box incorporates a WDM demultiplexer, integrated power meters, variable optical attenuators, and optical switches to form an integrated switch matrix. It enables receivers and transmitters to be tested at up to four wavelengths or channels.

ATE

ATE

The solution includes application development, DUT load-board design, and embedded high-throughput application libraries. These solutions enable fully automated, at-speed testing of high-speed I/O devices at up to 112 Gbps.

Loopback Tester

Loopback Tester

Loopbacks play an important role in the validation of next-generation Data Center communication systems. They emulate the exact behaviour of costlier optical transceivers and can be used to test the thermal and power loading characteristics of a system. In addition, they can be used to validate the signal integrity of host ports and test for CMIS compliance and interoperability.

AWG - Arbitrary Waveform Generator

With the rapid expansion of hyperscale data centres, the demand for high-performance Ethernet network infrastructure is soaring. As customer expectations for ultra-fast data throughput reach new heights, the need for cutting-edge testing solutions has never been greater.

Contact Sales

If you want to know more about our range of Test and Measurement Solutions, contact us at sales@frame.co.uk or fill in the form, and a member of our team will get in touch with you!  

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